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Patent Marketplace: Manufacturing

Communication system for the remote control of equipment (Hewlett-Packard): U.S. Patent No. 5,805,812

A communication system has a first computer, central controller and controlled equipment.

Computerized shipment error proofing system and method (Hewlett-Packard): U.S. Patent No. 5,923,014

The invention includes a method for error proofing shipments where users are presented with the options of parts marking, parts verification or pack verification using an output device.

System and method for device sequencing using discrete PLC control (Hewlett-Packard): U.S. Patent No. 6,897,675

A system and apparatus for discrete PLC control using word sequences in a data table for controlling a device on an assembly line.

Metal-Ligand and Process (Air Products and Chemicals): U.S. Patent Nos. 6,238,734 and 6,503,561Liquid precursor mixtures for deposition of multi-component metal containing materials”

These patents cover a composition for deposition of a mixed metal or metal compound layer, comprising a solvent-less mixture of at least two metal-ligand complex precursors, wherein the mixture is liquid at ambient conditions and the ligands are the same and are selected from the group consisting of alkyls, alkoxides, halides, hydrides, amides, imides, azides cyclopentadienyls, carbonyls, and their fluorine, oxygen and nitrogen substituted analogs.

Low Dielectric Constant (Air Products and Chemicals): U.S. Patent Nos. 7,122,880, 7,294,585 and 7,482,676 “Compositions for preparing low dielectric materials”

These patents relate to a material suitable for use, for example, in electronic devices. More specifically, the invention relates to a composition for making a low dielectric performance material or film comprising 15 same having an improved elastic modulus and a low dielectric constant.

Equipment and Analytical Instrumentation (Air Products and Chemicals): U.S. Patent Nos. 6,639,214 and 6,686,594           

Patent No. 6,639,214, “Method of improving the performance of an ion mobility spectrometer used to detect trace atmospheric impurities in gases,” is a method for eliminating interference when analyzing a test sample of a bulk inert gas in an ion mobility spectrometer is disclosed which includes the steps of providing an ionization source for the spectrometer to form ions of the bulk inert gas, mixing a reagent gas with the test sample prior to entry into the spectrometer to alter the nature of the ions formed by the bulk inert gas to shift the location of a bulk inert gas mobility peak such that a bulk inert gas mobility peak does not overlap with an impurity mobility peak of the ions of a trace impurity of interest, whereby bulk inert gas ions are quenched and a clusters of the reagent gas and the bulk gas are formed.

Patent No. 6,686,594, “An on-line halogen analyzer system and method of use for semiconductor processing effluent monitoring,” is a system that includes sampling the effluent stream into an absorption cell, and passing UV-Visible light through the effluent sample in the cell. After passing through the sample the light is collected by a photo detector for real-time wavelength-selective absorption analysis.

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